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Particle Adhesion
07 Jan 2008 | Tools | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Balachandran
Particle Adhesion
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SWOOP
16 Jan 2008 | Tools | Contributor(s): d s k, laelaf, shsu, pradeepsuresh
OWL Ontology Editor
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Hopper Flow Discharge
07 Jan 2008 | Tools | Contributor(s): d s k, Avik Sarkar, Carl Wassgren
DEM simulation of the discharge of particles from a hopper
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High Shear Mixer
07 Jan 2008 | Tools | Contributor(s): d s k, Avik Sarkar, Carl Wassgren
Analyze particles as they move through a high shear mixer
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Rotating Drum
07 Jan 2008 | Tools | Contributor(s): Avik Sarkar, Carl Wassgren, d s k
PharmaHUB Rotating Drum
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Ontological Informatics Infrastructure: An Overview
23 Jan 2008 | Online Presentations | Contributor(s): venkat, Rex Reklaitis, laelaf, pradeepsuresh
Pharmaceutical product development involves managing a large amount of information and knowledge in different formats. Ontological informatics is used to represent and integrate the information and knowledge and support product development applications.Venkat Venkatasubramanian,Chunhua Zhao,...
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Product Formulation
23 Jan 2008 | Online Presentations | Contributor(s): venkat, laelaf, pradeepsuresh
Pharmaceutical product development involves drug discovery,development of the drug substance (for improved processibility and absorption), anddevelopment of the drug product (identity and amount of excipients, choice of manufacturing platform or process).Product development requires access to...
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Information Representation in POPE
23 Jan 2008 | Online Presentations | Contributor(s): venkat, laelaf, Rex Reklaitis, pradeepsuresh
The development of a pharmaceutical product requires the collection of information during pre-formulation studies, product formulation, process development, scaleup and manufacturing. A large amount of information of different types, ranging from raw data to lab reports to sophisticated math...
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Navigating the POPE Ontology
21 Jan 2008 | Publications | Contributor(s): laelaf, venkat
What knowledge is included in POPE? There are three knowledge components: guideline knowledge, mathematical knowledge and information representations. The guideline knowledge component includes representations of actions and decisions. The mathematical knowledge component includes descriptions of...
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Purdue Ontology for Pharmaceutical Engineering
21 Jan 2008 | Series | Contributor(s): laelaf, venkat, shsu, pradeepsuresh
Web Ontology Language (OWL), recommended by and based from Resource Description Framework (W3C), is used to define ontologies. OWL uses XML syntax to express semantics. OWL can formalize a domain by defining classes, properties of these classes, and relations between them. OWL can also define...
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Ontological informatics infrastructure for pharmaceutical product development
17 Jan 2008 | Publications | Contributor(s): venkat, Rex Reklaitis, laelaf, pradeepsuresh
Informatics infrastructure plays a crucial role in supporting different decision making activities related to pharmaceutical product development, pilot plant and commercial scale manufacturing by streamlining information gathering, data integration, model development and managing all these for...
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Towards intelligent decision support for pharmaceutical product development
17 Jan 2008 | Publications | Contributor(s): venkat, Rex Reklaitis, laelaf, pradeepsuresh
Developing pharmaceutical product formulation in a timely manner and ensuring quality is a complex process that requires a systematic, science-based approach. Information from various categories, including properties of the drug substance and excipients, interactions between materials, unit...
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Roller Compactor
02 Jan 2008 | Tools | Contributor(s): Kamal Kuriyan
Calculate nip angle, normal and shear stresses for roller compactor using Johanson's model
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ParticleVis: A Tool for DEM Particle Visualization
07 Jan 2008 | Downloads | Contributor(s): Carl Wassgren, Avik Sarkar
ParticleVis is a visualization tool specialized for loading and exploring particulate simulation data. It contains a set of features that enables powerful and useful visualizations of particle simulations to be quickly generated. Support is provided for visualization of hundreds of thousands of...
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Pharmaceutical Informatics
30 Dec 2007 | Series | Contributor(s): venkat, Rex Reklaitis, laelaf, shsu, pradeepsuresh
Pharmaceutical products manufacturing is an important growth area for the US economy. Continued progress in biotechnology and genetic engineering coupled with an aging population will create both new mega-opportunities as well as pose new major challenges in this area, where the products are...
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Workspace
18 Dec 2007 | Tools | Contributor(s): Nicholas Kisseberth
Development workspace
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Roughness models for particle adhesion
20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The effects of different surface roughness models on a previously developed van der Waals adhesion model were examined. The van der Waals adhesion model represented surface roughness with a distribution of asperities. It was found that the constraints used todefine the asperity distribution on...
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Particle and Thin Film Adhesion
20 Dec 2007 | Series | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to surfaces using atomic force microscopy and develop experimentally-validated, science-based models...
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Simulation of the Adhesion of Particles to Surfaces
20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The removal of micrometer and submicrometer particles fromdielectric and metal films represents a challenge in postchemicalmechanical polishing cleaning. Proper modeling of the adhesiveforce between contaminant particles and these films is needed todevelop optimal solutions to postchemical...
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Hamaker Constants in Integrated Circuit Metallization
20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
A new method for determining Hamaker constants was examinedfor materials of interest in integrated circuit manufacture. Anultra-high vacuum atomic force microscope and an atomic force microscopeoperated in a nitrogen environment were used to measurethe interaction forces between metals,...