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  1. Particle Adhesion

    07 Jan 2008 | Tools | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Balachandran

    Particle Adhesion

  2. SWOOP

    16 Jan 2008 | Tools | Contributor(s): d s  k, laelaf, shsu, pradeepsuresh

    OWL Ontology Editor

  3. Hopper Flow Discharge

    07 Jan 2008 | Tools | Contributor(s): d s  k, Avik Sarkar, Carl Wassgren

    DEM simulation of the discharge of particles from a hopper

  4. High Shear Mixer

    07 Jan 2008 | Tools | Contributor(s): d s  k, Avik Sarkar, Carl Wassgren

    Analyze particles as they move through a high shear mixer

  5. Rotating Drum

    07 Jan 2008 | Tools | Contributor(s): Avik Sarkar, Carl Wassgren, d s  k

    PharmaHUB Rotating Drum

  6. Ontological Informatics Infrastructure: An Overview

    23 Jan 2008 | Online Presentations | Contributor(s): venkat, Rex Reklaitis, laelaf, pradeepsuresh

    Pharmaceutical product development involves managing a large amount of information and knowledge in different formats. Ontological informatics is used to represent and integrate the information and knowledge and support product development applications.Venkat Venkatasubramanian,Chunhua Zhao,...

  7. Product Formulation

    23 Jan 2008 | Online Presentations | Contributor(s): venkat, laelaf, pradeepsuresh

    Pharmaceutical product development involves drug discovery,development of the drug substance (for improved processibility and absorption), anddevelopment of the drug product (identity and amount of excipients, choice of manufacturing platform or process).Product development requires access to...

  8. Information Representation in POPE

    23 Jan 2008 | Online Presentations | Contributor(s): venkat, laelaf, Rex Reklaitis, pradeepsuresh

    The development of a pharmaceutical product requires the collection of information during pre-formulation studies, product formulation, process development, scaleup and manufacturing. A large amount of information of different types, ranging from raw data to lab reports to sophisticated math...

  9. Navigating the POPE Ontology

    21 Jan 2008 | Publications | Contributor(s): laelaf, venkat

    What knowledge is included in POPE? There are three knowledge components: guideline knowledge, mathematical knowledge and information representations. The guideline knowledge component includes representations of actions and decisions. The mathematical knowledge component includes descriptions of...

  10. Purdue Ontology for Pharmaceutical Engineering

    21 Jan 2008 | Series | Contributor(s): laelaf, venkat, shsu, pradeepsuresh

    Web Ontology Language (OWL), recommended by and based from Resource Description Framework (W3C), is used to define ontologies. OWL uses XML syntax to express semantics. OWL can formalize a domain by defining classes, properties of these classes, and relations between them. OWL can also define...

  11. Ontological informatics infrastructure for pharmaceutical product development

    17 Jan 2008 | Publications | Contributor(s): venkat, Rex Reklaitis, laelaf, pradeepsuresh

    Informatics infrastructure plays a crucial role in supporting different decision making activities related to pharmaceutical product development, pilot plant and commercial scale manufacturing by streamlining information gathering, data integration, model development and managing all these for...

  12. Towards intelligent decision support for pharmaceutical product development

    17 Jan 2008 | Publications | Contributor(s): venkat, Rex Reklaitis, laelaf, pradeepsuresh

    Developing pharmaceutical product formulation in a timely manner and ensuring quality is a complex process that requires a systematic, science-based approach. Information from various categories, including properties of the drug substance and excipients, interactions between materials, unit...

  13. Roller Compactor

    02 Jan 2008 | Tools | Contributor(s): Kamal Kuriyan

    Calculate nip angle, normal and shear stresses for roller compactor using Johanson's model

  14. ParticleVis: A Tool for DEM Particle Visualization

    07 Jan 2008 | Downloads | Contributor(s): Carl Wassgren, Avik Sarkar

    ParticleVis is a visualization tool specialized for loading and exploring particulate simulation data. It contains a set of features that enables powerful and useful visualizations of particle simulations to be quickly generated. Support is provided for visualization of hundreds of thousands of...

  15. Pharmaceutical Informatics

    30 Dec 2007 | Series | Contributor(s): venkat, Rex Reklaitis, laelaf, shsu, pradeepsuresh

    Pharmaceutical products manufacturing is an important growth area for the US economy. Continued progress in biotechnology and genetic engineering coupled with an aging population will create both new mega-opportunities as well as pose new major challenges in this area, where the products are...

  16. Workspace

    18 Dec 2007 | Tools | Contributor(s): Nicholas Kisseberth

    Development workspace

  17. Roughness models for particle adhesion

    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The effects of different surface roughness models on a previously developed van der Waals adhesion model were examined. The van der Waals adhesion model represented surface roughness with a distribution of asperities. It was found that the constraints used todefine the asperity distribution on...

  18. Particle and Thin Film Adhesion

    20 Dec 2007 | Series | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to surfaces using atomic force microscopy and develop experimentally-validated, science-based models...

  19. Simulation of the Adhesion of Particles to Surfaces

    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The removal of micrometer and submicrometer particles fromdielectric and metal films represents a challenge in postchemicalmechanical polishing cleaning. Proper modeling of the adhesiveforce between contaminant particles and these films is needed todevelop optimal solutions to postchemical...

  20. Hamaker Constants in Integrated Circuit Metallization

    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    A new method for determining Hamaker constants was examinedfor materials of interest in integrated circuit manufacture. Anultra-high vacuum atomic force microscope and an atomic force microscopeoperated in a nitrogen environment were used to measurethe interaction forces between metals,...