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Collaboration for pharmaceutical engineering and science
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07 Jan 2008 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Balachandran
Roughness models for particle adhesion
20 Dec 2007 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The effects of different surface roughness models on a previously developed van der Waals adhesion model were examined. The van der Waals adhesion model represented surface roughness with a distribution of asperities. It was found that the constraints used todefine the asperity distribution on...
Particle and Thin Film Adhesion
The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to surfaces using atomic force microscopy and develop experimentally-validated, science-based models...