The Particle Adhesion Model simulates the van der Waals adhesion force between a particle and a substrate in a given medium for a user-specified number of interactions. The force constant is based on the composition of the particle, the substrate and the medium in which the interactions occur. The particle and sustrate surfaces are brought into contact multiple times with a variety of orientations. The topography of the two surfaces is based on either actual experimental data or ideal mathematically-generated surface. The surface is then re-oriented using a Fast Fourier Transform simulation. The number of interactions is based on the number of times the surface is regenerated as well as the number of locations on the substrate with which the particle comes into contact.

As the particle and substrate come into contact, a distribution of adhesion force values will result from the matching and mis-matching of surface features.

INPUT PARAMETERS:
Particle: Roughness, Geometry;
Substrate : Roughness;
Hamaker Constant;
Surfaces Generated;
Locations on the Surface.

OUTPUT RESULTS:
Force values and statistics.

Simulation tool developed by School of Chemical Engineering, Purdue University. Professor Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Kumar Balachandran.

Researchers should cite this work as follows:

• Stephen Beaudoin; Ravi Jaiswal; Caitlin Kilroy; Dave Balachandran (2014), "Particle Adhesion," https://pharmahub.org/resources/partad.

  BibTex | EndNote

1. Fast fourier transform
2. Hamaker constants
3. Particle adhesion
4. Surface roughness
5. Van der waals force