Resources (1-5 of 5)

1. Discussion on Hamaker Constant

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   09 May 2008 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

   The Hamaker constant is a force constant used for describing the van der Waals (vdW) force. The magnitude of the Hamaker constant reflects the strength of the vdW force between two particles, or between a particle and a substrate. It depends on the material properties of both the interacting...

2. Particle Adhesion

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   07 Jan 2008 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Balachandran

   Particle Adhesion

3. Particle and Thin Film Adhesion

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   20 Dec 2007 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

   The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to surfaces using atomic force microscopy and develop experimentally-validated, science-based models...

4. Hamaker Constants in Integrated Circuit Metallization

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   20 Dec 2007 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

   A new method for determining Hamaker constants was examinedfor materials of interest in integrated circuit manufacture. Anultra-high vacuum atomic force microscope and an atomic force microscopeoperated in a nitrogen environment were used to measurethe interaction forces between metals,...

5. A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films

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   20 Dec 2007 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

   The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have estimates of surface/intermolecular forces between interacting bodies to describe and to manipulate the...