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Publications (1-4 of 4)

  1. Discussion on Hamaker Constant

    09 May 2008 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The Hamaker constant is a force constant used for describing the van der Waals (vdW) force. The magnitude of the Hamaker constant reflects the strength of the vdW force between two particles, or...

    https://pharmahub.org/resources/206

  2. Simulation of the Adhesion of Particles to Surfaces

    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The removal of micrometer and submicrometer particles from dielectric and metal films represents a challenge in postchemical mechanical polishing cleaning. Proper modeling of the adhesive force...

    https://pharmahub.org/resources/21

  3. Hamaker Constants in Integrated Circuit Metallization

    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    A new method for determining Hamaker constants was examined for materials of interest in integrated circuit manufacture. An ultra-high vacuum atomic force microscope and an atomic force...

    https://pharmahub.org/resources/23

  4. A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films

    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have...

    https://pharmahub.org/resources/25