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A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films
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20 Dec 2007 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have estimates of surface/intermolecular forces between interacting bodies to describe and to manipulate the...
Discussion on Hamaker Constant
09 May 2008 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The Hamaker constant is a force constant used for describing the van der Waals (vdW) force. The magnitude of the Hamaker constant reflects the strength of the vdW force between two particles, or between a particle and a substrate. It depends on the material properties of both the interacting...
Hamaker Constants in Integrated Circuit Metallization
A new method for determining Hamaker constants was examinedfor materials of interest in integrated circuit manufacture. Anultra-high vacuum atomic force microscope and an atomic force microscopeoperated in a nitrogen environment were used to measurethe interaction forces between metals,...
07 Jan 2008 | | Contributor(s):: Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Balachandran
Particle and Thin Film Adhesion
The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to surfaces using atomic force microscopy and develop experimentally-validated, science-based models...