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Simulation of the Adhesion of Particles to Surfaces
Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The removal of micrometer and submicrometer particles from
dielectric and metal films represents a challenge in postchemical
mechanical polishing cleaning. Proper modeling of the adhesive
force …
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Hamaker Constants in Integrated Circuit Metallization
Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
A new method for determining Hamaker constants was examined
for materials of interest in integrated circuit manufacture. An
ultra-high vacuum atomic force microscope and an atomic force …
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A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films
Teaching Materials | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have estimates …
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Particle and Thin Film Adhesion
Series | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to …
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Particle Adhesion
Tools | Contributor(s): Stephen Beaudoin, dsk , Ravi Jaiswal, Caitlin Kilroy
The van der Waals adhesion force between a particle and a substrate in a given medium is simulated for a specified number of interactions.