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Online Simulation

And More

  1. Knowledge-based systems
  2. Discrete element model (DEM)
  3. QbD presentation
  4. Van der waals force
  5. Particle adhesion
  6. Process modeling
  7. Hamaker constants
  8. Particle-based computations
  9. Roller compaction
  10. Johanson's model
  11. Dry granulation
  12. Statistical model building
  13. Molecular modeling
  14. Excipients
  15. Visualization
  16. Database
  17. Active pharmaceutical ingredient (API)

Other

Databases

Tags: Particle adhesion

Resources (1-8 of 8) feed

  1. Discussion on Hamaker Constant

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    09 May 2008 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The Hamaker constant is a force constant used for describing the van der Waals (vdW) force. The magnitude of the Hamaker constant reflects the strength of the vdW force between two particles, or …

    http://pharmahub.org/resources/206

  2. Basic Forces in Particle Adhesion

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    28 Jan 2008 | Online Presentations | Contributor(s): Stephen Beaudoin

    Particle adhesion to surfaces is important in a wide range of industrial applications. This brief presentation is designed to provide an introduction to the forces that influence particle adhesion …

    http://pharmahub.org/resources/130

  3. Particle Adhesion

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    07 Jan 2008 | Tools | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Balachandran

    Particle Adhesion

    http://pharmahub.org/resources/partad

  4. Roughness models for particle adhesion

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    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The effects of different surface roughness models on a previously developed van der Waals adhesion model were examined. The van der Waals adhesion model represented surface roughness with a …

    http://pharmahub.org/resources/27

  5. Particle and Thin Film Adhesion

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    20 Dec 2007 | Series | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to …

    http://pharmahub.org/resources/29

  6. Simulation of the Adhesion of Particles to Surfaces

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    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The removal of micrometer and submicrometer particles from dielectric and metal films represents a challenge in postchemical mechanical polishing cleaning. Proper modeling of the adhesive force …

    http://pharmahub.org/resources/21

  7. Hamaker Constants in Integrated Circuit Metallization

    0.0 out of 5 stars 

    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    A new method for determining Hamaker constants was examined for materials of interest in integrated circuit manufacture. An ultra-high vacuum atomic force microscope and an atomic force microscope …

    http://pharmahub.org/resources/23

  8. A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films

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    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have estimates …

    http://pharmahub.org/resources/25

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