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Simulation of the Adhesion of Particles to Surfaces
20 Dec. 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The removal of micrometer and submicrometer particles from
dielectric and metal films represents a challenge in postchemical
mechanical polishing cleaning. Proper modeling of the adhesive
force …
http://pharmahub.org/resources/21
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Hamaker Constants in Integrated Circuit Metallization
20 Dec. 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
A new method for determining Hamaker constants was examined
for materials of interest in integrated circuit manufacture. An
ultra-high vacuum atomic force microscope and an atomic force …
http://pharmahub.org/resources/23
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A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films
20 Dec. 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have estimates …
http://pharmahub.org/resources/25
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Roughness models for particle adhesion
20 Dec. 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The effects of different surface roughness models on a previously developed van der Waals adhesion model were examined. The van der Waals adhesion model represented surface roughness with a …
http://pharmahub.org/resources/27
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Particle and Thin Film Adhesion
20 Dec. 2007 | Series | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles to …
http://pharmahub.org/resources/29