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Discussion on Hamaker Constant
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09 May 2008 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The Hamaker constant is a force constant used for describing the van der Waals (vdW) force. The magnitude of the Hamaker constant reflects the strength of the vdW force between two particles, or...
07 Jan 2008 | Tools | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy, Dave Balachandran
Particle and Thin Film Adhesion
20 Dec 2007 | Series | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
The adhesion of micron and sub-micron scale particles to surfaces is of tremendous interest in a wide range of industrial and civilian applications. We measure directly the adhesion of particles...
Hamaker Constants in Integrated Circuit Metallization
20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy
A new method for determining Hamaker constants was examined
for materials of interest in integrated circuit manufacture. An
ultra-high vacuum atomic force microscope and an atomic force...
A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films
The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have...