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Online Simulation

And More

  1. Knowledge-based systems
  2. Discrete element model (DEM)
  3. Particle adhesion
  4. Van der waals force
  5. Hamaker constants
  6. Process modeling
  7. Particle-based computations
  8. Molecular modeling
  9. Johanson's model
  10. Roller compaction
  11. Statistical model building
  12. Dry granulation
  13. Visualization
  14. Active pharmaceutical ingredient (API)
  15. Surface roughness
  16. Fast fourier transform
  17. Crystal graph

Other

Particle Adhesion

Particle Adhesion

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Version 2.0 - published on 25 Jan 2008

This tool is closed source.

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Description

The Particle Adhesion Model simulates the van der Waals adhesion force between a particle and a substrate in a given medium for a user-specified number of interactions. The force constant is based on the composition of the particle, the substrate and the medium in which the interactions occur. The particle and sustrate surfaces are brought into contact multiple times with a variety of orientations. The topography of the two surfaces is based on either actual experimental data or ideal mathematically-generated surface. The surface is then re-oriented using a Fast Fourier Transform simulation. The number of interactions is based on the number of times the surface is regenerated as well as the number of locations on the substrate with which the particle comes into contact.

As the particle and substrate come into contact, a distribution of adhesion force values will result from the matching and mis-matching of surface features.

INPUT PARAMETERS:
Particle: Roughness, Geometry;
Substrate : Roughness;
Hamaker Constant;
Surfaces Generated;
Locations on the Surface.

OUTPUT RESULTS:
Force values and statistics.

credits

Simulation tool developed by
School of Chemical Engineering,
Purdue University.
Professor Stephen Beaudoin,
Ravi Jaiswal,
Caitlin Kilroy.

Cite this work

Researchers should cite this work as follows:

  • Stephen Beaudoin; dsk   ; Ravi Jaiswal; Caitlin Kilroy (2008), "Particle Adhesion," http://pharmahub.org/resources/partad.

    BibTex | EndNote

Tags
  1. Fast fourier transform
  2. Hamaker constants
  3. Particle adhesion
  4. Surface roughness
  5. Van der waals force

Supporting Documents

[ none ]