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Particle Adhesion

Posted 07 Jan, 2008 in Tools

Launch Tool

This tool is closed source.

Version 2.0 - published on 25 Jan. 2008
Contributor(s) Stephen Beaudoin
Purdue University

dsk  , Ravi Jaiswal

Caitlin Kilroy
Purdue University
Description

The Particle Adhesion Model simulates the van der Waals adhesion force between a particle and a substrate in a given medium for a user-specified number of interactions. The force constant is based on the composition of the particle, the substrate and the medium in which the interactions occur. The particle and sustrate surfaces are brought into contact multiple times with a variety of orientations. The topography of the two surfaces is based on either actual experimental data or ideal mathematically-generated surface. The surface is then re-oriented using a Fast Fourier Transform simulation. The number of interactions is based on the number of times the surface is regenerated as well as the number of locations on the substrate with which the particle comes into contact.

As the particle and substrate come into contact, a distribution of adhesion force values will result from the matching and mis-matching of surface features.

INPUT PARAMETERS:
Particle: Roughness, Geometry;
Substrate : Roughness;
Hamaker Constant;
Surfaces Generated;
Locations on the Surface.

OUTPUT RESULTS:
Force values and statistics.

Credits

Simulation tool developed by
School of Chemical Engineering,
Purdue University.
Professor Stephen Beaudoin,
Ravi Jaiswal,
Caitlin Kilroy.

Cite this work

If you reference this work in a publication, please cite as follows:

  • Beaudoin, Stephen;   , dsk; Jaiswal, Ravi; Kilroy, Caitlin (2008), "Particle Adhesion," http://pharmahub.org/resources/partad?v=101.

    BibTex | EndNote