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Online Simulation

And More

  1. Knowledge-based systems
  2. Discrete element model (DEM)
  3. Particle adhesion
  4. Van der waals force
  5. Hamaker constants
  6. Process modeling
  7. Particle-based computations
  8. Molecular modeling
  9. Johanson's model
  10. Roller compaction
  11. Statistical model building
  12. Dry granulation
  13. Visualization
  14. Active pharmaceutical ingredient (API)
  15. Surface roughness
  16. Fast fourier transform
  17. Crystal graph

Other

Caitlin Kilroy

Contributions

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Publications 7 results

  1. Discussion on Hamaker Constant

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    09 May 2008 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The Hamaker constant is a force constant used for describing the van der Waals (vdW) force. The magnitude of the Hamaker constant reflects the strength of the vdW force between two particles, or between a particle and a substrate. It depends on the material properties of both the interacting bodies …

  2. Roughness models for particle adhesion

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    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The effects of different surface roughness models on a previously developed van der Waals adhesion model were examined. The van der Waals adhesion model represented surface roughness with a distribution of asperities. It was found that the constraints used to define the asperity distribution on …

  3. Simulation of the Adhesion of Particles to Surfaces

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    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The removal of micrometer and submicrometer particles from dielectric and metal films represents a challenge in postchemical mechanical polishing cleaning. Proper modeling of the adhesive force between contaminant particles and these films is needed to develop optimal solutions to postchemical …

  4. Hamaker Constants in Integrated Circuit Metallization

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    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    A new method for determining Hamaker constants was examined for materials of interest in integrated circuit manufacture. An ultra-high vacuum atomic force microscope and an atomic force microscope operated in a nitrogen environment were used to measure the interaction forces between metals, …

  5. A Theoretical and Experimental Study of Surface Forces in Adhesion of Particles to Thin Films

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    20 Dec 2007 | Publications | Contributor(s): Stephen Beaudoin, Ravi Jaiswal, Caitlin Kilroy

    The interactions between micron- and nano-particles and rough surfaces are of great importance and have numerous applications in surface science and biotechnology. It is essential to have estimates of surface/intermolecular forces between interacting bodies to describe and to manipulate the nature …

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